Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications, Fachbücher

Reliability Of High Mobility Sige Channel Mosfets For Future Cmos

Jacopo Franco (u. A.) | Reliability Of High Mobility Sige Channel

Techniques for Power and Reliability Optimization of CMOS Logic, Fachbücher

High-Resolution and High-Speed Integrated CMOS AD Converters for Low-Power Applications, Fachbücher

An Improved Mosfet I-V Model and its Application in Nano-Cmos Circuits, Fachbücher

Intelligent Solutions for Cities and Mobility of the Future, Fachbücher

Design for Yield and Reliability for Nanometer CMOS Digital Circuits, Fachbücher

Design of RF-CMOS Power Splitter for RFID Applications, Fachbücher

Application of Reliability Techniques, Fachbücher

Safety for Future Transport and Mobility, Fachbücher

Subthreshold Surface Potential Model for Short-Channel Mosfet, Fachbücher

Design and Implementation of CMOS Power Amplifier for GSM Applications, Fachbücher

Remedies of Short Channel Effects in Conventional MOSFET, Fachbücher

CMOS LNA Design for GSM Applications, Fachbücher

Metal Gate Materials for CMOS Application, Fachbücher